A.I. Matveev¹, A.V. Pivak^{1, 2}, I.P. Chirkov¹

¹FSUE “VNIIFTRI”, Mendeleevo, Moscow region, Russia;
² LLC “Planar”, Chelyabinsk, Russia;
mtvv@vniiftri.ru,
alexey.pivak@planarchel.ru,
chirkov@vniiftri.ru

Al’manac of Modern Metrology № 3 (43) 2025, pages 142–159

The page of the article in Russian

Abstract. This paper provides analysis of items, which could be included in waveguide calibration kits, possible types of calibration routines for vector network analyzers (VNA) and comparison of these routines in terms of measurement uncertainty. Calculated esti­ma­tion of uncertainty is confirmed during type approval procedures of some test and measu­rement devices. Preferable set of items for calibration kits is defined together with its specification in form of nominal values as well as in form of uncertainty of measured values. Some proposal about establishing dependency between uncertainties of calibration kits and calibrated VNA is given.

Keywords: metrology, measurement systems, calibration kits, waveguide paths, S-para­meters, reflection and transmission coefficients

Full texts of articles are available only in Russian in printed issues of the magazine.

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