K.S. Tkachenko

FSAEI HE “Sevastopol State University”, Sevastopol
KSTkachenko@sevsu.ru

Al’manac of Modern Metrology № 4 (20) 2019, pages 200–205

Modern measuring instruments are very complex and include computer equipment. Components of such devices can degrade under the influence of changes in the characteristics of the input stream of events. After degradation to a certain level, the measuring device can not recover and self-recover. Therefore, an analytical model of such a device is proposed. On the basis of this model it is possible to make expedient repair and recovery work.

Key words: measuring device, computer units, queuing systems, analytical modeling.

Full texts of articles are available only in Russian in printed issues of the magazine.