Simulation of random processes to improve the reliability of measuring instruments

K.S. Tkachenko

FSAEI HE “Sevastopol State University”, Sevastopol, Russia

Al’manac of Modern Metrology № 2 (26) 2021, pages 142–147

Annotation. Changes and quantitative growth in the characteristics and number of measuring devices forces changes in environmental control methods. Building new models for measuring de-vices changes the nature of the work performed on measurement to a simpler one. In this paper, we consider an approach for obtaining new instrument models in the framework of complex instrument systems. The approach is based on the use of Ito processes, which are used for statistical evaluation of the descriptive characteristics of measuring devices.

Key words: Ito process, statistical estimates.

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